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Accuracy and Loss
Activation Function
AI Chips for Training and Inference
Artifacts
Artificial General Intelligence (AGI)
AUC (Area under the ROC Curve)
Automated Machine Learning (AutoML)
CI/CD for Machine Learning
Comparison of ML Frameworks
Confusion Matrix
Containers
Convergence
Convolutional Neural Network (CNN)
Data Science vs Machine Learning vs Deep Learning
Datasets and Machine Learning
Distributed Training (TensorFlow, MPI, & Horovod)
Epochs, Batch Size, & Iterations
ETL
Features, Feature Engineering, & Feature Stores
Generative Adversarial Network (GAN)
Gradient Boosting
Gradient Descent
Hyperparameter Optimization
Interpretability
Jupyter Notebooks
Kubernetes
Linear Regression
Logistic Regression
Long Short-Term Memory (LSTM)
Machine Learning Models Explained
Machine Learning Operations (MLOps)
Managing Machine Learning Models
Metrics in Machine Learning
ML Showcase
MNIST
Model Deployment (Inference)
Model Drift & Decay
Model Training
Overfitting vs Underfitting
Random Forest
Recurrent Neural Network (RNN)
Reproducibility in Machine Learning
REST and gRPC
Serverless ML: FaaS and Lambda
Structured vs Unstructured Data
Supervised, Unsupervised, & Reinforcement Learning
Synthetic Data
Tensor Processing Unit (TPU)
TensorBoard
Transfer Learning
Weights and Biases
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Bridging the divide between design and manufacturing in the field of optical devices.
April 11, 2024
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